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| Carrier lifetime measurements (1) |
| Contact resistivities (1) |
| Crystalline materials (1) |
| Crystalline silicon surfaces (1) |
| Deposition (1) |
| electron-selective contact (1) |
| Open circuit voltage (1) |
| Oxide films (1) |
| P-type float-zone silicon (1) |
| Passivation (1) |
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