Noa, J.; Soto, P.J.; Costa, G.A.O.P.; Wittich, D.; Feitosa, R.Q.; Rottensteiner, F.
(Katlenburg-Lindau : Copernicus, 2021)
Although very efficient in a number of application fields, deep learning based models are known to demand large amounts of labeled data for training. Particularly for remote sensing applications, responding to that demand ...