Schaefer, C.; Kirk, A.T.; Allers, M.; Zimmermann, S.: Ion Mobility Shift of Isotopologues in a High Kinetic Energy Ion Mobility Spectrometer (HiKE-IMS) at Elevated Effective Temperatures. In: Journal of the American Society for Mass Spectrometry : JASMS online 31 (2020), Nr. 10, S. 2093-2101. DOI: https://doi.org/10.1021/jasms.0c00220
Abstract: | |
Ion mobility spectrometers (IMS) separate ions mainly by ion–neutral collision cross section and to a lesser extent by ion mass and effective temperature. When investigating isotopologues, the difference in collision cross section can be assumed negligible. Since the mobility shift of isotopologues is thus mainly caused by their difference in mass and effective temperature, the investigation of isotopologues can provide important insights into the theory of ion mobility. However, in classical IMS operated at ambient pressure, cluster formation with neutral molecules occurs, which significantly influences the mobility shift of isotopologues and thus makes a sound investigation of the effect of ion mass and effective temperature on the ion mobility difficult. In this work, the relative ion mobility of several organic compounds and their 13C-labeled isotopologues is studied in a High Kinetic Energy Ion Mobility Spectrometer (HiKE-IMS) at high reduced electric fields up to 120 Td, which allows the investigation of nonclustered ion species and thus enables a sound investigation of the mobility shift of isotopologues. The results show that the measured relative ion mobilities of isotopologues having the same effective temperature and, thus, their ion mass dominating the relative ion mobility agree well with theoretical relative ion mobilities predicted by the theory of ion mobility. | |
License of this version: | Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
Document Type: | Article |
Publishing status: | acceptedVersion |
Issue Date: | 2020-09-02 |
Appears in Collections: | Fakultät für Elektrotechnik und Informatik |
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