Steckenreiter, Verena; Walter, Dominic C.; Schmidt, Jan
(Melville, NY : American Institute of Physics Inc., 2017)
Based on contactless carrier lifetime measurements performed on p-type boron-doped Czochralski-grown silicon (Cz-Si) wafers, we examine the rate constant Rde of the permanent deactivation process of the boron-oxygen-related ...