Schinke, Carsten; Peest, Peter Christian; Bothe, Karsten; Schmidt, Jan; Brendel, Rolf; Vogt, Malte R.; Kröger, Ingo; Winter, Stefan; Schirmacher, Alfred; Lim, Siew; Nguyen, Hieu T.; MacDonald, Daniel
(Amsterdam : Elsevier, 2015)
Based on a combined analysis of spectroscopic ellipsometry, reflectance and transmittance measurements as well as spectrally resolved luminescence measurements and spectral responsivity measurements, we present data of the ...